Light Image Particle Measurement Device "HAVER CPA System"
Accurately measure the quality of materials! High-precision optical image particle analysis is possible!
The "HAVER CPA System" is energy-efficient and low-maintenance. It also reduces operational costs. It can be easily connected to a PLC control system and can be integrated into online processes without modifications later on. The measurement results are equivalent to or better than traditional sieve analysis, offering high reproducibility, significant time savings, and information on particle shape and count, among various other advantages. 【Features】 ■ Accurately measures material quality ■ High-precision measurements in all situations ■ Comprehensive peripheral devices ■ Special solutions for special tasks ■ Extensive product lineup *For more details, please refer to the PDF materials or feel free to contact us.
- Company:コーレンス
- Price:Other